BKK19-416 - Automating test results analysis using neural networks

Session Abstract

Test results triage is the most time-consuming step currently in Texas Instruments CI cycle. Embedded tests are more susceptible to failures caused by external factors due to test setup complexity. A typical embedded test contains multiple points of failure.
This work uses a neural network to classify test results automatically and to detect real regressions. It helps scaling TIs validation cycle by automating the most time-consuming step.

Session Speakers

Carlos Hernandez

Integration & Validation mgr (Texas Instruments)

15+ years of experience in the embedded industry.
Co-author of Opentest validation framewrok.
Linux Integration & Validation manager at TI since 2015.

Jonah Willis

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